NIS Colloquium

Microanalysis and micromodification of materials

by ion beams

Torino, Tuesday 19 and Wednesday 20 December, 2006

Istituto Chimico – Via Pietro Giuria 7

Organizers: Claudio Manfredotti and Ettore Vittone

PROGRAM

Tuesday 19^th – Aula Magna
14^15 – 14^30	Adriano Zecchina – NIS Torino (I) Opening and NIS presentation
14^30 – 14^45	Ettore Vittone – NIS Torino (I) “Applications of ion microscopy and spectroscopy: an introduction”
14^45 – 15^30	Pier Andrea Mando’ – LABEC, Firenze (I) The external beams and microbeams of LABEC (Florence)
15^30 – 16^15	Paolo Olivero – MARC, Melbourne (AU) Modification and nano-fabrication of diamond crystals with focused ion beams
16^15 – 16^45	Coffee break
16^45 – 17^30	Dietmar Fink – Hahn-Meitner-Institut, Berlin (D) Ion track based nanoelectronics with solid or liquid working media
17^30 - 18^15	Pier Andrea Mando’ – LABEC, Firenze (I) “The external beams and microbeams of LABEC (Florence)”
Wednesday 20^th – Aula Avogadro
09^30 – 10^15	Ettore Vittone – NIS Torino (I) Semiconductor characterization by scanning ion beam induced charge (IBIC) microscopy
10^15 – 11^00	Paul Sellin – University of Surrey (UK) IBIC studies of charge transport in wide bandgap semiconductors
11^00 – 11^30	Coffee break
11^30 – 12^15	Milko Jakšić – Ruđer Bošković Institute, Zagreb (HR) Characterisation of materials and radiation damage induced changes using heavy ion beams
12^15 – 12^30	Concluding remarks