Collection efficiency map of a GaAs sample (frontal IBIC). The circular region corresponds to the upper electrode irradiated by 2.4 MeV protons. The bias voltage is 200 V. It is evident a drop of silver paste and the shadow of the gold wire used for bonding. The colour scale (reported in the image) represents the value of the charge collection efficiency.

  1. F.Nava, P. Vanni, C. Canali, C. Manfredotti, P. Polesello, E. Vittone, G. Egeni, V. Rudello, "Analysis of Uniformity of as Prepared and Irradiated S.I. GaAs Radiation Detectors" , Presented at IEEE - Nuclear Science Symposium 1997 - Albuquerque (USA), 9-15 November 1997, to be published on IEEE - NSS97 Conference Records
  1. E.Vittone, C. Manfredotti, F. Fizzotti, K.Mirri, E.Gargioni, P. Polesello, A. Lo Giudice, S.Galassini, F.Nava, P.Vanni, P.Rossi, "IBIC analysis of gallium arsenide Schottky diodes" , Submitted at 6th Int. Conf. on Nuclear Microprobe Technology and Applications, Spier Estate, South Africa, 11-16 October 1998, and to be published on NIM B

 

 

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